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Process Transfers
at IQE Silicon
IQE Silicon has a successful track record of matching existing
qualified processes to provide its customers with a strategic
second source. Our comprehensive set of film characterisation
tools allows us to match the doping profile and other key
characteristics of customer epitaxial films exactly.
Reactor process recipes can be tuned to minimize autodoping,
up-diffusion and slip whilst simultaneously maintaining
excellent uniformity and particle control.
A wide
range of technologies have been successfully transferred and
qualified at IQE Silicon including:-
BiCMOS
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Availability of advanced wet cleaning processes enables
residual oxide layers to be removed from the wafer surface
with excellent particle control. Cleans can also be
optimized to avoid defects due to high buried layer dopant
concentrations.
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Dopant profiles can be matched to any existing epitaxy
process using SRP (spreading resistance probe) analysis and
tailoring the reactor process recipe to obtain the required
result. SRP analysis is typically performed on all
differently doped regions of the wafer (some of our customer
processes run with multiple buried layers). This ensures
that wafers processed at IQE have identical electrical
performance to wafers processed at the original source.
SiGe HBT
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Low temperature SiGe processes for drift-field and
box-structure SiGe HBTs are available with dopant profiles
tailored to match the exact requirements of the customer.
IQE has considerable experience of both HBT process transfer
and process development.
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Our advanced single wafer reactors (ASM Epsilon 2000) are
capable of providing robust processes with excellent profile
control and uniformity.
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Advanced metrology tools such as SIMS (secondary ion mass
spectroscopy), SE (spectroscopic ellipsometry) and XRD
(x-ray diffraction) are available for detailed film
characterisation.
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We
have an automated wet bench capable of the HF-last
pre-cleans essential to successful HBT process transfer.
Degasification and hydrogenation of our final rinse DI water
provides excellent hydrogen termination needed for low
temperature epitaxy processes.
Selective Epitaxy
Blanket Epitaxy
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A
wide range of film thickness and resistivities are available
using industry standard dopants (Boron, Phosphorus and
Arsenic).
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Transition widths can be engineered to customer requirements
and confirmed using SRP.
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Multiple epitaxy films can be deposited for certain device
applications such as Power –MOS and P-i-N diodes.
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Robust slip-free silicon epitaxy processes on SOI wafers are
available (this is challenging due to the materials mismatch
at the wafer edge)
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